LEEM-PEEM Microscope à électrons lents - Microscope Electronique à Photo-Emission

• Chemistry - Materials
• Mineral (materials, nanomaterials)
• Complex systems and software engineering
• Photonics - optical materials, application nanotechnology

Technological platform

Several types of electron microscopy are available at IRAMIS: In LEEM microscopy, slow electrons (electron energy of a few electron volts, during interaction) are backscattered on the surface of a sample, which can be visualised with a very high resolution. This microscope also allows the image of the surface from the photo-emitted electrons following a laser or synchrotron radiation illumination (PEEM: Photo-Emission Electron Microscopy).