• Chemistry - Materials
  • Complex systems and software engineering

LEEM-PEEM Microscope à électrons lents - Microscope Electronique à Photo-Emission

Technological platform


Several types of electron microscopy are available at IRAMIS: In LEEM microscopy, slow electrons (electron energy of a few electron volts, during interaction) are backscattered on the surface of a sample, which can be visualised with a very high resolution.
This microscope also allows the image of the surface from the photo-emitted electrons following a laser or synchrotron radiation illumination (PEEM: Photo-Emission Electron Microscopy).


Innovation themes

Map and access

P.020 Bât.462 Commissariat à l'énergie atomique et aux énergies alternatives (CEA) D36
91400 SACLAY

Formations offers

Offres de formations