• Chemistry - Materials
  • Complex systems and software engineering

Diffraction des Rayons X en incidence rasante / sur couches minces

Technological platform


X-ray diffractometry is an analytical technique based on the diffraction of X-rays from matter. The general method consists of bombarding the sample with X-rays, and analysing the intensity of the X-rays which are scattered according to their orientation in space. The scattered X-rays interfere with each other, so the intensity shows maxima in certain directions, a phenomenon known as "diffraction". The intensity detected is then recorded as a function of the beam deflection angle 2.


  • Mr Jérémy FORTÉ

Innovation themes

Lab of attachment

Map and access

Rue du doyen Georges Poitou
ICMMO, campus universitaire d'Orsay (Bât 410)
91400 ORSAY