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Chemistry - Materials
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Complex systems and software engineering
Diffraction des Rayons X en incidence rasante / sur couches minces
Technological platform
X-ray diffractometry is an analytical technique based on the diffraction of X-rays from matter. The general method consists of bombarding the sample with X-rays, and analysing the intensity of the X-rays which are scattered according to their orientation in space. The scattered X-rays interfere with each other, so the intensity shows maxima in certain directions, a phenomenon known as "diffraction". The intensity detected is then recorded as a function of the beam deflection angle 2.
Innovation themes
Lab of attachment
Rue du doyen Georges Poitou
ICMMO, campus universitaire d'Orsay (Bât 410)
91400 ORSAY